“Embedded neural network (NN) implementations are susceptible to misclassification under fault attacks. Injecting strong electromagnetic (EM) pulses is a non-invasive yet detrimental attack that affects the NN operations by (i) causing faults in the NN model/inputs while being read by the NN computation unit and (ii) corrupting NN computations results to cause misclassification eventually. This paper presents the first ASIC demonstration of an energy-efficient NN accelerator with inbuilt fault attack detection.”

Find the paper and full list of authors in the European Conference on Solid-State Circuits proceedings.